The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Fizemos um estudo experimental para investigar o efeito do estresse térmico devido ao aquecedor para ajuste da altura de vôo adaptativa (AFH) na legibilidade e instabilidade dos sensores de magnetorresistência de tunelamento (TMR). A cabeça deslizante consiste em um pequeno aquecedor próximo aos elementos de leitura/gravação para controlar a folga entre os elementos de leitura/gravação e o meio de gravação do sistema de gravação magnética. É relatado pela primeira vez que o estresse térmico do aquecedor AFH induz instabilidades e causa degradação da cabeça. O estresse térmico degrada o desempenho do leitor, induzindo flutuações de tensão e grandes picos de ruído que fazem com que o sistema de gravação magnética tenha uma baixa taxa de erro de bit (BER). O circuito aberto da curva de transferência indica que a inversão de uma magnetização de borda antiferromagnética sintética (SAF) causa essas instabilidades. O estresse térmico reduz o campo de polarização de troca e a barreira de energia para quebrar a magnetização da borda SAF. A dispersão e a estabilidade térmica da camada antiferromagnética (AFM) são as causas potenciais dessas instabilidades do SAF porque a maior dispersão do AFM nessas cabeças fornece menos campo estabilizador líquido para as camadas do SAF, o que reduz a barreira de energia para quebrar a magnetização da borda do SAF. Imagens de microscópio eletrônico de varredura (SEM) dessas cabeças fracas mostram superfícies ásperas e arranhões próximos ao elemento sensor. O estresse mecânico devido a esses arranhões pode impactar adicionalmente o campo estabilizador do SAF.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copiar
Damrongsak TONGSOMPORN, Nitin AFZULPURKAR, Brent BARGMANN, Lertsak LEKAWAT, Apirat SIRITARATIWAT, "An Experimental Study of Head Instabilities in TMR Sensors for Magnetic Recording Heads with Adaptive Flying Height" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 12, pp. 1958-1965, December 2008, doi: 10.1093/ietele/e91-c.12.1958.
Abstract: We did an experimental study to investigate the effect of the thermal stress due to the heater for adjusting adaptive flying height (AFH) on the readability and instability of tunneling magnetoresistance (TMR) sensors. The slider head consists of a small heater nearby the read/write elements for controlling the clearance between the read/write elements and the recording medium of the magnetic recording system. It is firstly reported that the thermal stress from the AFH heater induces instabilities and caused head degradation. The thermal stress degrades the reader performance by inducing voltage fluctuations and large noise spikes that causes the magnetic recording system having poor bit error rate (BER). The open loop of the transfer curve indicates that the flipping of a synthetic antiferromagnet (SAF) edge magnetization causes these instabilities. The thermal stress reduces the exchange bias field and the energy barrier to flop the SAF edge magnetization. The dispersion and thermal stability of the antiferromagnetic (AFM) layer are the potential root causes of these SAF instabilities because the larger AFM dispersion in these heads gives less net stabilizing field to SAF layers that lowers the energy barrier to flop the SAF edge magnetization. Scanning electron microscope (SEM) images of these weak heads show rough surface and scratches close to the sensor element. The mechanical stress due to these scratches may additionally impact to the stabilizing field of the SAF.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.12.1958/_p
Copiar
@ARTICLE{e91-c_12_1958,
author={Damrongsak TONGSOMPORN, Nitin AFZULPURKAR, Brent BARGMANN, Lertsak LEKAWAT, Apirat SIRITARATIWAT, },
journal={IEICE TRANSACTIONS on Electronics},
title={An Experimental Study of Head Instabilities in TMR Sensors for Magnetic Recording Heads with Adaptive Flying Height},
year={2008},
volume={E91-C},
number={12},
pages={1958-1965},
abstract={We did an experimental study to investigate the effect of the thermal stress due to the heater for adjusting adaptive flying height (AFH) on the readability and instability of tunneling magnetoresistance (TMR) sensors. The slider head consists of a small heater nearby the read/write elements for controlling the clearance between the read/write elements and the recording medium of the magnetic recording system. It is firstly reported that the thermal stress from the AFH heater induces instabilities and caused head degradation. The thermal stress degrades the reader performance by inducing voltage fluctuations and large noise spikes that causes the magnetic recording system having poor bit error rate (BER). The open loop of the transfer curve indicates that the flipping of a synthetic antiferromagnet (SAF) edge magnetization causes these instabilities. The thermal stress reduces the exchange bias field and the energy barrier to flop the SAF edge magnetization. The dispersion and thermal stability of the antiferromagnetic (AFM) layer are the potential root causes of these SAF instabilities because the larger AFM dispersion in these heads gives less net stabilizing field to SAF layers that lowers the energy barrier to flop the SAF edge magnetization. Scanning electron microscope (SEM) images of these weak heads show rough surface and scratches close to the sensor element. The mechanical stress due to these scratches may additionally impact to the stabilizing field of the SAF.},
keywords={},
doi={10.1093/ietele/e91-c.12.1958},
ISSN={1745-1353},
month={December},}
Copiar
TY - JOUR
TI - An Experimental Study of Head Instabilities in TMR Sensors for Magnetic Recording Heads with Adaptive Flying Height
T2 - IEICE TRANSACTIONS on Electronics
SP - 1958
EP - 1965
AU - Damrongsak TONGSOMPORN
AU - Nitin AFZULPURKAR
AU - Brent BARGMANN
AU - Lertsak LEKAWAT
AU - Apirat SIRITARATIWAT
PY - 2008
DO - 10.1093/ietele/e91-c.12.1958
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2008
AB - We did an experimental study to investigate the effect of the thermal stress due to the heater for adjusting adaptive flying height (AFH) on the readability and instability of tunneling magnetoresistance (TMR) sensors. The slider head consists of a small heater nearby the read/write elements for controlling the clearance between the read/write elements and the recording medium of the magnetic recording system. It is firstly reported that the thermal stress from the AFH heater induces instabilities and caused head degradation. The thermal stress degrades the reader performance by inducing voltage fluctuations and large noise spikes that causes the magnetic recording system having poor bit error rate (BER). The open loop of the transfer curve indicates that the flipping of a synthetic antiferromagnet (SAF) edge magnetization causes these instabilities. The thermal stress reduces the exchange bias field and the energy barrier to flop the SAF edge magnetization. The dispersion and thermal stability of the antiferromagnetic (AFM) layer are the potential root causes of these SAF instabilities because the larger AFM dispersion in these heads gives less net stabilizing field to SAF layers that lowers the energy barrier to flop the SAF edge magnetization. Scanning electron microscope (SEM) images of these weak heads show rough surface and scratches close to the sensor element. The mechanical stress due to these scratches may additionally impact to the stabilizing field of the SAF.
ER -