The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Expressões simples para resistência à constrição de múltiplos pontos condutores foram formuladas analiticamente por Greenwood. Essas expressões, no entanto, incluem algumas aproximações. Nakamura apresentou que a resistência à constrição de um ponto circular calculada usando o BEM é próxima do valor exato de Maxwell. Este erro relativo é apenas e=0. 00162 [%]. Neste estudo, as resistências de constrição de dois, cinco e dez pontos condutores são calculadas utilizando o método dos elementos de contorno (BEM), e comparadas com aquelas obtidas através das expressões de Greenwood. À medida que os pontos condutores se aproximam uns dos outros, os desvios numéricos entre as resistências de constrição calculadas usando as expressões de Greenwood e o BEM aumentam. Como resultado, a resistência mútua calculada pelo BEM é maior do que a obtida pelas expressões de Greenwood. Os desvios numéricos entre as resistências totais calculadas pelas expressões de Greenwood e as do BEM são pequenos. Portanto, as expressões de Greenwood são válidas para o cálculo da resistência de constrição total e podem ser aplicadas a problemas onde apenas a resistência total de duas superfícies de contato, como um relé e uma chave, é necessária. No entanto, os desvios numéricos entre as resistências parciais calculadas pela expressão de Greenwood e pelo BEM são muito grandes. Os cálculos de resistência parcial de vários pontos condutores estão além da faixa aplicável da expressão de Greenwood, uma vez que a expressão de Greenwood para a resistência à constrição de dois pontos condutores é obtida assumindo que os pontos condutores são de tamanho igual. Em particular, o desvio entre as resistências dos pontos condutores, que estão próximos uns dos outros, é muito grande. No caso de resistências parciais significativas em dispositivos semicondutores, as expressões de Greenwood não podem ser utilizadas com alta precisão.
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Hitoshi NISHIYAMA, Isao MINOWA, "A Study of the Approximate Expressions for Constriction Resistance of Multitude Conducting Spots" in IEICE TRANSACTIONS on Electronics,
vol. E82-C, no. 1, pp. 25-32, January 1999, doi: .
Abstract: Simple expressions for constriction resistance of multitude conducting spots were analytically formulated by Greenwood. These expressions, however, include some approximations. Nakamura presented that the constriction resistance of one circular spot computed using the BEM is closed to Maxwell's exact value. This relative error is only e=0. 00162 [%]. In this study, the constriction resistances of two, five and ten conducting spots are computed using the boundary element method (BEM), and compared with those obtained using Greenwood's expressions. As the conducting spots move close to each other, the numerical deviations between constriction resistances computed using Greenwood's expressions and the BEM increase. As a result, mutual resistance computed by the BEM is larger than that obtained from Greenwood's expressions. The numerical deviations between the total resistances computed by Greenwood's expressions and that by the BEM are small. Hence, Greenwood's expressions are valid for the total constriction resistance calculation and can be applied to problems where only the total resistance of two contact surfaces, such as a relay and a switch, is required. However, the numerical deviations between the partial resistances computed by Greenwood's expression and that by the BEM are very large. The partial resistance calculations of multitude conducting spots are beyond the applicable range of Greenwood's expression, since Greenwood's expression for constriction resistance of two conducting spots is obtained by assuming that the conducting spots are equal size. In particular, the deviation between resistances of conducting spots, which are close to each other, is very large. In the case of partial resistances which are significant in semiconductor devices, Greenwood's expressions cannot be used with high precision.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_1_25/_p
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@ARTICLE{e82-c_1_25,
author={Hitoshi NISHIYAMA, Isao MINOWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Study of the Approximate Expressions for Constriction Resistance of Multitude Conducting Spots},
year={1999},
volume={E82-C},
number={1},
pages={25-32},
abstract={Simple expressions for constriction resistance of multitude conducting spots were analytically formulated by Greenwood. These expressions, however, include some approximations. Nakamura presented that the constriction resistance of one circular spot computed using the BEM is closed to Maxwell's exact value. This relative error is only e=0. 00162 [%]. In this study, the constriction resistances of two, five and ten conducting spots are computed using the boundary element method (BEM), and compared with those obtained using Greenwood's expressions. As the conducting spots move close to each other, the numerical deviations between constriction resistances computed using Greenwood's expressions and the BEM increase. As a result, mutual resistance computed by the BEM is larger than that obtained from Greenwood's expressions. The numerical deviations between the total resistances computed by Greenwood's expressions and that by the BEM are small. Hence, Greenwood's expressions are valid for the total constriction resistance calculation and can be applied to problems where only the total resistance of two contact surfaces, such as a relay and a switch, is required. However, the numerical deviations between the partial resistances computed by Greenwood's expression and that by the BEM are very large. The partial resistance calculations of multitude conducting spots are beyond the applicable range of Greenwood's expression, since Greenwood's expression for constriction resistance of two conducting spots is obtained by assuming that the conducting spots are equal size. In particular, the deviation between resistances of conducting spots, which are close to each other, is very large. In the case of partial resistances which are significant in semiconductor devices, Greenwood's expressions cannot be used with high precision.},
keywords={},
doi={},
ISSN={},
month={January},}
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TY - JOUR
TI - A Study of the Approximate Expressions for Constriction Resistance of Multitude Conducting Spots
T2 - IEICE TRANSACTIONS on Electronics
SP - 25
EP - 32
AU - Hitoshi NISHIYAMA
AU - Isao MINOWA
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 1999
AB - Simple expressions for constriction resistance of multitude conducting spots were analytically formulated by Greenwood. These expressions, however, include some approximations. Nakamura presented that the constriction resistance of one circular spot computed using the BEM is closed to Maxwell's exact value. This relative error is only e=0. 00162 [%]. In this study, the constriction resistances of two, five and ten conducting spots are computed using the boundary element method (BEM), and compared with those obtained using Greenwood's expressions. As the conducting spots move close to each other, the numerical deviations between constriction resistances computed using Greenwood's expressions and the BEM increase. As a result, mutual resistance computed by the BEM is larger than that obtained from Greenwood's expressions. The numerical deviations between the total resistances computed by Greenwood's expressions and that by the BEM are small. Hence, Greenwood's expressions are valid for the total constriction resistance calculation and can be applied to problems where only the total resistance of two contact surfaces, such as a relay and a switch, is required. However, the numerical deviations between the partial resistances computed by Greenwood's expression and that by the BEM are very large. The partial resistance calculations of multitude conducting spots are beyond the applicable range of Greenwood's expression, since Greenwood's expression for constriction resistance of two conducting spots is obtained by assuming that the conducting spots are equal size. In particular, the deviation between resistances of conducting spots, which are close to each other, is very large. In the case of partial resistances which are significant in semiconductor devices, Greenwood's expressions cannot be used with high precision.
ER -