The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Desenvolvemos um novo tipo de sistema de sondagem elétrica baseado em um microscópio de força atômica. Este método permite medir simultaneamente a topografia superficial e o potencial superficial de filmes finos contendo grãos de cristal. As mudanças potenciais locais obtidas fornecem uma visão sobre a condução através dos grãos e seus limites.
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Kazuhiro KUDO, Masaaki IIZUKA, Shigekazu KUNIYOSHI, Kuniaki TANAKA, "Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope" in IEICE TRANSACTIONS on Electronics,
vol. E83-C, no. 7, pp. 1069-1070, July 2000, doi: .
Abstract: We have developed a new type electrical probing system based on an atomic force microscope. This method enables us to measure simultaneously the surface topography and surface potential of thin films containing the crystal grains. The obtained local potential changes give an insight into conduction through the grains and their boundaries.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_7_1069/_p
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@ARTICLE{e83-c_7_1069,
author={Kazuhiro KUDO, Masaaki IIZUKA, Shigekazu KUNIYOSHI, Kuniaki TANAKA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope},
year={2000},
volume={E83-C},
number={7},
pages={1069-1070},
abstract={We have developed a new type electrical probing system based on an atomic force microscope. This method enables us to measure simultaneously the surface topography and surface potential of thin films containing the crystal grains. The obtained local potential changes give an insight into conduction through the grains and their boundaries.},
keywords={},
doi={},
ISSN={},
month={July},}
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TY - JOUR
TI - Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope
T2 - IEICE TRANSACTIONS on Electronics
SP - 1069
EP - 1070
AU - Kazuhiro KUDO
AU - Masaaki IIZUKA
AU - Shigekazu KUNIYOSHI
AU - Kuniaki TANAKA
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2000
AB - We have developed a new type electrical probing system based on an atomic force microscope. This method enables us to measure simultaneously the surface topography and surface potential of thin films containing the crystal grains. The obtained local potential changes give an insight into conduction through the grains and their boundaries.
ER -