The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
É apresentado um sistema de imagem baseado em óptica de Fourier para fontes de interferência eletromagnética (EMI). É necessário diminuir as emissões indesejadas para atender aos requisitos de EMI. Para investigar este problema, uma visualização de campos emissores eletromagnéticos (EM) é muito útil. Neste artigo, propomos um sistema de imagem passivo de campos emissores de EM baseado na óptica de Fourier. Os valores de amplitude e fase dos campos difratados em uma pupila de entrada são adquiridos usando um interferômetro de seis portas. Os campos EM medidos são então processados em um computador e uma imagem é recuperada usando uma transformada inversa de Fresnel. São apresentados experimentos que demonstram o potencial do método proposto. O sistema proposto é útil não apenas no campo da compatibilidade eletromagnética (EMC), mas também para elucidação científica para discutir a óptica e a teoria das microondas do mesmo ponto de vista.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copiar
Hiroshi HIRAYAMA, Toshiyuki YAKABE, Yoshio KAMI, "An Imaging System for EM Emitting Sources Using a Six-Port Interferometer" in IEICE TRANSACTIONS on Electronics,
vol. E84-C, no. 12, pp. 1885-1891, December 2001, doi: .
Abstract: A Fourier-optics based imaging system for electromagnetic interference (EMI) sources is presented. It is necessary to decrease undesired emissions in order to meet EMI requirements. To investigate this problem, a visualization of electromagnetic (EM) emitting fields is very useful. In this paper, we propose a passive imaging system of EM emitting fields based on Fourier optics. Amplitude and phase values of diffracted fields on an entrance pupil are acquired by using a six-port interferometer. The measured EM fields are then processed on a computer, and an image is retrieved using an inverse Fresnel transform. Experiments are presented, which demonstrate the potential of the proposed method. The proposed system is useful not only in the field of electromagnetic compatibility (EMC), but also for scientific elucidation to discuss the optics and microwave theory of the same viewpoint.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e84-c_12_1885/_p
Copiar
@ARTICLE{e84-c_12_1885,
author={Hiroshi HIRAYAMA, Toshiyuki YAKABE, Yoshio KAMI, },
journal={IEICE TRANSACTIONS on Electronics},
title={An Imaging System for EM Emitting Sources Using a Six-Port Interferometer},
year={2001},
volume={E84-C},
number={12},
pages={1885-1891},
abstract={A Fourier-optics based imaging system for electromagnetic interference (EMI) sources is presented. It is necessary to decrease undesired emissions in order to meet EMI requirements. To investigate this problem, a visualization of electromagnetic (EM) emitting fields is very useful. In this paper, we propose a passive imaging system of EM emitting fields based on Fourier optics. Amplitude and phase values of diffracted fields on an entrance pupil are acquired by using a six-port interferometer. The measured EM fields are then processed on a computer, and an image is retrieved using an inverse Fresnel transform. Experiments are presented, which demonstrate the potential of the proposed method. The proposed system is useful not only in the field of electromagnetic compatibility (EMC), but also for scientific elucidation to discuss the optics and microwave theory of the same viewpoint.},
keywords={},
doi={},
ISSN={},
month={December},}
Copiar
TY - JOUR
TI - An Imaging System for EM Emitting Sources Using a Six-Port Interferometer
T2 - IEICE TRANSACTIONS on Electronics
SP - 1885
EP - 1891
AU - Hiroshi HIRAYAMA
AU - Toshiyuki YAKABE
AU - Yoshio KAMI
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E84-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2001
AB - A Fourier-optics based imaging system for electromagnetic interference (EMI) sources is presented. It is necessary to decrease undesired emissions in order to meet EMI requirements. To investigate this problem, a visualization of electromagnetic (EM) emitting fields is very useful. In this paper, we propose a passive imaging system of EM emitting fields based on Fourier optics. Amplitude and phase values of diffracted fields on an entrance pupil are acquired by using a six-port interferometer. The measured EM fields are then processed on a computer, and an image is retrieved using an inverse Fresnel transform. Experiments are presented, which demonstrate the potential of the proposed method. The proposed system is useful not only in the field of electromagnetic compatibility (EMC), but also for scientific elucidation to discuss the optics and microwave theory of the same viewpoint.
ER -