The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Efeitos da impressão na margem do sinal em FeRAM com Pt/SrBi2Ta2O9Capacitores /Pt foram investigados. A impressão, induzida durante o armazenamento em alta temperatura, reduziu significativamente a margem do sinal e, portanto, determina a vida útil do FeRAM. A margem de sinal inicial de 470 mV é reduzida para 290 mV após armazenamento a 175
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Young Min KANG, Seaung Suk LEE, Beelyong YANG, Choong Heui CHUNG, Hun Woo KYE, Suk Kyoung HONG, Nam Soo KANG, "Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi2Ta2O9/Pt Capacitor" in IEICE TRANSACTIONS on Electronics,
vol. E84-C, no. 6, pp. 757-762, June 2001, doi: .
Abstract: Effects of imprint on signal margin in FeRAM with Pt/SrBi2Ta2O9/Pt capacitors have been investigated. Imprint, induced during high temperature storage, significantly reduced the signal margin and hence determines lifetime of FeRAM. Initial signal margin of 470 mV is reduced to 290 mV after storage at 175
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e84-c_6_757/_p
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@ARTICLE{e84-c_6_757,
author={Young Min KANG, Seaung Suk LEE, Beelyong YANG, Choong Heui CHUNG, Hun Woo KYE, Suk Kyoung HONG, Nam Soo KANG, },
journal={IEICE TRANSACTIONS on Electronics},
title={Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi2Ta2O9/Pt Capacitor},
year={2001},
volume={E84-C},
number={6},
pages={757-762},
abstract={Effects of imprint on signal margin in FeRAM with Pt/SrBi2Ta2O9/Pt capacitors have been investigated. Imprint, induced during high temperature storage, significantly reduced the signal margin and hence determines lifetime of FeRAM. Initial signal margin of 470 mV is reduced to 290 mV after storage at 175
keywords={},
doi={},
ISSN={},
month={June},}
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TY - JOUR
TI - Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi2Ta2O9/Pt Capacitor
T2 - IEICE TRANSACTIONS on Electronics
SP - 757
EP - 762
AU - Young Min KANG
AU - Seaung Suk LEE
AU - Beelyong YANG
AU - Choong Heui CHUNG
AU - Hun Woo KYE
AU - Suk Kyoung HONG
AU - Nam Soo KANG
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E84-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2001
AB - Effects of imprint on signal margin in FeRAM with Pt/SrBi2Ta2O9/Pt capacitors have been investigated. Imprint, induced during high temperature storage, significantly reduced the signal margin and hence determines lifetime of FeRAM. Initial signal margin of 470 mV is reduced to 290 mV after storage at 175
ER -