The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Demonstramos microscopia óptica de varredura de campo próximo sem abertura usando uma pequena saliência (uma simples partícula de poliestireno de 500 nm de diâmetro) em um substrato de vidro plano como sonda. Projetamos um pequeno estágio de amostra para operar com a sonda de partículas. É uma platina circular de 40 µm de diâmetro, fabricada a partir de uma fibra óptica por ataque com ácido fluorídrico (HF). Neste artigo, apresentamos o primeiro microscópio de força atômica e imagens de microscópio óptico de campo próximo obtidas com tal sonda. Também discutimos esquemas para controle de distância sonda-amostra nesta nova forma de microscopia óptica de campo próximo de varredura sem abertura.
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Noritaka YAMAMOTO, Takashi HIRAGA, "Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy" in IEICE TRANSACTIONS on Electronics,
vol. E85-C, no. 12, pp. 2104-2108, December 2002, doi: .
Abstract: We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-µm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e85-c_12_2104/_p
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@ARTICLE{e85-c_12_2104,
author={Noritaka YAMAMOTO, Takashi HIRAGA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy},
year={2002},
volume={E85-C},
number={12},
pages={2104-2108},
abstract={We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-µm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.},
keywords={},
doi={},
ISSN={},
month={December},}
Copiar
TY - JOUR
TI - Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy
T2 - IEICE TRANSACTIONS on Electronics
SP - 2104
EP - 2108
AU - Noritaka YAMAMOTO
AU - Takashi HIRAGA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E85-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2002
AB - We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-µm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.
ER -