The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Neste artigo apresentamos um estudo sobre a otimização do projeto de osciladores controlados por tensão. O ruído de fase dos osciladores do tipo LC é basicamente limitado pelo fator de qualidade dos indutores. Foi demonstrado experimentalmente que indutores de Q mais alto podem ser alcançados em frequências mais altas, enquanto a frequência de oscilação é limitada por capacitâncias parasitas. Neste artigo, o tamanho mínimo do transistor e a degradação do fator de qualidade causado por um arranjo de capacitores chaveados são estimados analiticamente, e a frequência máxima de oscilação dos VCOs também é derivada de um circuito equivalente, considerando capacitâncias parasitas. De acordo com a avaliação analítica, o ruído de fase de um VCO usando um CMOS de 65 nm é 2 dB melhor que o de um CMOS de 180 nm.
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Rui MURAKAMI, Shoichi HARA, Kenichi OKADA, Akira MATSUZAWA, "Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 6, pp. 777-784, June 2010, doi: 10.1587/transele.E93.C.777.
Abstract: In this paper we present a study on the design optimization of voltage-controlled oscillators. The phase noise of LC-type oscillators is basically limited by the quality factor of inductors. It has been experimentally shown that higher-Q inductors can be achieved at higher frequencies while the oscillation frequency is limited by parasitic capacitances. In this paper, the minimum transistor size and the degradation of the quality factor caused by a switched-capacitor array are analytically estimated, and the maximum oscillation frequency of VCOs is also derived from an equivalent circuit by considering parasitic capacitances. According to the analytical evaluation, the phase noise of a VCO using a 65 nm CMOS is 2 dB better than that of a 180 nm CMOS.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.777/_p
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@ARTICLE{e93-c_6_777,
author={Rui MURAKAMI, Shoichi HARA, Kenichi OKADA, Akira MATSUZAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators},
year={2010},
volume={E93-C},
number={6},
pages={777-784},
abstract={In this paper we present a study on the design optimization of voltage-controlled oscillators. The phase noise of LC-type oscillators is basically limited by the quality factor of inductors. It has been experimentally shown that higher-Q inductors can be achieved at higher frequencies while the oscillation frequency is limited by parasitic capacitances. In this paper, the minimum transistor size and the degradation of the quality factor caused by a switched-capacitor array are analytically estimated, and the maximum oscillation frequency of VCOs is also derived from an equivalent circuit by considering parasitic capacitances. According to the analytical evaluation, the phase noise of a VCO using a 65 nm CMOS is 2 dB better than that of a 180 nm CMOS.},
keywords={},
doi={10.1587/transele.E93.C.777},
ISSN={1745-1353},
month={June},}
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TY - JOUR
TI - Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators
T2 - IEICE TRANSACTIONS on Electronics
SP - 777
EP - 784
AU - Rui MURAKAMI
AU - Shoichi HARA
AU - Kenichi OKADA
AU - Akira MATSUZAWA
PY - 2010
DO - 10.1587/transele.E93.C.777
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2010
AB - In this paper we present a study on the design optimization of voltage-controlled oscillators. The phase noise of LC-type oscillators is basically limited by the quality factor of inductors. It has been experimentally shown that higher-Q inductors can be achieved at higher frequencies while the oscillation frequency is limited by parasitic capacitances. In this paper, the minimum transistor size and the degradation of the quality factor caused by a switched-capacitor array are analytically estimated, and the maximum oscillation frequency of VCOs is also derived from an equivalent circuit by considering parasitic capacitances. According to the analytical evaluation, the phase noise of a VCO using a 65 nm CMOS is 2 dB better than that of a 180 nm CMOS.
ER -