The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Neste artigo, é proposto um novo circuito caótico com longa vida útil. O circuito proposto consiste em circuitos de células caóticas de tempo discreto acoplados a NMOS. Ao empregar o fenômeno de sincronização do caos, o circuito proposto pode alcançar uma longa vida útil. Como o circuito proposto é menos suscetível a quebras, a taxa do produto aceitável para o caos IC pode ser melhorada. Além disso, graças ao acoplamento por meio de NMOSFETs, a perda da linha de conexão entre circuitos celulares caóticos pode ser controlada eletronicamente. Portanto, o sistema proposto, projetado usando técnicas de corrente comutada (SI), é útil como ferramenta experimental para analisar fenômenos de sincronização do caos. A validade dos circuitos propostos é confirmada por simulações e experimentos computacionais.
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Kei EGUCHI, Fumio UENO, Toru TABATA, Hongbing ZHU, Takahiro INOUE, "Design of a Discrete-Time Chaos Circuit with Long Working-Life" in IEICE TRANSACTIONS on Fundamentals,
vol. E83-A, no. 11, pp. 2303-2311, November 2000, doi: .
Abstract: In this paper, a novel chaos circuit with long working-life is proposed. The proposed circuit consists of NMOS-coupled discrete-time chaotic cell circuits. By employing chaos synchronization phenomenon, the proposed circuit can achieve long working-life. Since the proposed circuit is less susceptible to breakdown, the rate of the acceptable product for chaos IC can be improved. Furthermore, thanks to the coupling by using NMOSFET's, the loss of the connection line between chaotic cell circuits can be controlled electronically. Therefore, the proposed system designed by using switched-current (SI) techniques is useful as an experimental tool to analyze chaos synchronization phenomena. The validity of the proposed circuits is confirmed by computer simulations and experiments.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e83-a_11_2303/_p
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@ARTICLE{e83-a_11_2303,
author={Kei EGUCHI, Fumio UENO, Toru TABATA, Hongbing ZHU, Takahiro INOUE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Design of a Discrete-Time Chaos Circuit with Long Working-Life},
year={2000},
volume={E83-A},
number={11},
pages={2303-2311},
abstract={In this paper, a novel chaos circuit with long working-life is proposed. The proposed circuit consists of NMOS-coupled discrete-time chaotic cell circuits. By employing chaos synchronization phenomenon, the proposed circuit can achieve long working-life. Since the proposed circuit is less susceptible to breakdown, the rate of the acceptable product for chaos IC can be improved. Furthermore, thanks to the coupling by using NMOSFET's, the loss of the connection line between chaotic cell circuits can be controlled electronically. Therefore, the proposed system designed by using switched-current (SI) techniques is useful as an experimental tool to analyze chaos synchronization phenomena. The validity of the proposed circuits is confirmed by computer simulations and experiments.},
keywords={},
doi={},
ISSN={},
month={November},}
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TY - JOUR
TI - Design of a Discrete-Time Chaos Circuit with Long Working-Life
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2303
EP - 2311
AU - Kei EGUCHI
AU - Fumio UENO
AU - Toru TABATA
AU - Hongbing ZHU
AU - Takahiro INOUE
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E83-A
IS - 11
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - November 2000
AB - In this paper, a novel chaos circuit with long working-life is proposed. The proposed circuit consists of NMOS-coupled discrete-time chaotic cell circuits. By employing chaos synchronization phenomenon, the proposed circuit can achieve long working-life. Since the proposed circuit is less susceptible to breakdown, the rate of the acceptable product for chaos IC can be improved. Furthermore, thanks to the coupling by using NMOSFET's, the loss of the connection line between chaotic cell circuits can be controlled electronically. Therefore, the proposed system designed by using switched-current (SI) techniques is useful as an experimental tool to analyze chaos synchronization phenomena. The validity of the proposed circuits is confirmed by computer simulations and experiments.
ER -