The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
FPGA que explora via-switches, que são uma espécie de RAMs resistivas não voláteis, para implementação de crossbar está chamando a atenção devido à sua alta densidade de integração e eficiência energética. A crossbar via-switch é responsável pelo roteamento do sinal nas interconexões, alterando os estados ligado/desligado dos via-switches. Para verificar a funcionalidade da barra transversal via-switch após a fabricação, é essencial realizar testes de falha que verifiquem se podemos ligar/desligar os via-switches normalmente. Este artigo confirma que um comparador de par diferencial geral discrimina com sucesso os estados ligado/desligado de comutadores via e esclarece os modos de falha de um comutador via por simulação SPICE em nível de transistor que injeta falhas ligadas/desligadas presas no comutador atômico e no varistor, onde um via-switch consiste em dois interruptores atômicos e dois varistores. Propomos então uma metodologia de diagnóstico de falhas para chaves via na barra transversal que diagnostica os modos de falta de acordo com a diferença de resposta do comparador entre as chaves via normais e com falha. O método proposto atinge 100% de detecção de falhas, verificando as respostas do comparador após ligar/desligar o via-switch. Caso o número de componentes defeituosos em um via-switch seja um, a proporção do diagnóstico de falha, que identifica exatamente o varistor e a chave átomo defeituosa dentro do via-switch defeituoso, é de 100%, e no caso de até dois falhas, a taxa de diagnóstico de falhas é de 79%.
Ryutaro DOI
Osaka University
Xu BAI
NEC Corporation
Toshitsugu SAKAMOTO
NEC Corporation
Masanori HASHIMOTO
Osaka University
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Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO, "A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA" in IEICE TRANSACTIONS on Fundamentals,
vol. E103-A, no. 12, pp. 1447-1455, December 2020, doi: 10.1587/transfun.2020VLP0005.
Abstract: FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2020VLP0005/_p
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@ARTICLE{e103-a_12_1447,
author={Ryutaro DOI, Xu BAI, Toshitsugu SAKAMOTO, Masanori HASHIMOTO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA},
year={2020},
volume={E103-A},
number={12},
pages={1447-1455},
abstract={FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.},
keywords={},
doi={10.1587/transfun.2020VLP0005},
ISSN={1745-1337},
month={December},}
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TY - JOUR
TI - A Fault Detection and Diagnosis Method for Via-Switch Crossbar in Non-Volatile FPGA
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1447
EP - 1455
AU - Ryutaro DOI
AU - Xu BAI
AU - Toshitsugu SAKAMOTO
AU - Masanori HASHIMOTO
PY - 2020
DO - 10.1587/transfun.2020VLP0005
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E103-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2020
AB - FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%.
ER -