The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Este artigo apresenta uma análise sistêmica do desempenho do ruído de fase do oscilador de quadratura em série (QOSC) usando o modelo de função de sensibilidade ao impulso variante no tempo (ISF). O ISF efetivo para cada fonte de ruído no oscilador é derivado matematicamente. De acordo com esses ISFs efetivos, a expressão explícita de forma fechada para o ruído de fase devido ao ruído térmico total na série QOSC é derivada, e a contribuição do ruído de fase do ruído de cintilação nos transistores regenerativos e de acoplamento também é calculada. As contribuições do ruído de fase do ruído térmico e do ruído de cintilação são verificadas por simulações SpectreRF.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copiar
Jinhua LIU, Guican CHEN, Hong ZHANG, "A Time-Variant Analysis of Phase Noise in Series Quadrature Oscillators" in IEICE TRANSACTIONS on Fundamentals,
vol. E94-A, no. 2, pp. 574-582, February 2011, doi: 10.1587/transfun.E94.A.574.
Abstract: This paper presents a systemic analysis for phase noise performances of the series quadrature oscillator (QOSC) by using the time-variant impulse sensitivity function (ISF) model. The effective ISF for each noise source in the oscillator is derived mathematically. According to these effective ISFs, the explicit closed-form expression for phase noise due to the total thermal noise in the series QOSC is derived, and the phase noise contribution from the flicker noise in the regenerative and coupling transistors is also figured out. The phase noise contributions from the thermal noise and the flicker noise are verified by SpectreRF simulations.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E94.A.574/_p
Copiar
@ARTICLE{e94-a_2_574,
author={Jinhua LIU, Guican CHEN, Hong ZHANG, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Time-Variant Analysis of Phase Noise in Series Quadrature Oscillators},
year={2011},
volume={E94-A},
number={2},
pages={574-582},
abstract={This paper presents a systemic analysis for phase noise performances of the series quadrature oscillator (QOSC) by using the time-variant impulse sensitivity function (ISF) model. The effective ISF for each noise source in the oscillator is derived mathematically. According to these effective ISFs, the explicit closed-form expression for phase noise due to the total thermal noise in the series QOSC is derived, and the phase noise contribution from the flicker noise in the regenerative and coupling transistors is also figured out. The phase noise contributions from the thermal noise and the flicker noise are verified by SpectreRF simulations.},
keywords={},
doi={10.1587/transfun.E94.A.574},
ISSN={1745-1337},
month={February},}
Copiar
TY - JOUR
TI - A Time-Variant Analysis of Phase Noise in Series Quadrature Oscillators
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 574
EP - 582
AU - Jinhua LIU
AU - Guican CHEN
AU - Hong ZHANG
PY - 2011
DO - 10.1587/transfun.E94.A.574
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E94-A
IS - 2
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - February 2011
AB - This paper presents a systemic analysis for phase noise performances of the series quadrature oscillator (QOSC) by using the time-variant impulse sensitivity function (ISF) model. The effective ISF for each noise source in the oscillator is derived mathematically. According to these effective ISFs, the explicit closed-form expression for phase noise due to the total thermal noise in the series QOSC is derived, and the phase noise contribution from the flicker noise in the regenerative and coupling transistors is also figured out. The phase noise contributions from the thermal noise and the flicker noise are verified by SpectreRF simulations.
ER -