The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
O teste multiciclo parece uma maneira promissora de reduzir o tempo de aplicação de teste do POST (Power-on Self-Test) para alcançar uma alta cobertura de falhas especificada pela ISO26262 para testar dispositivos automotivos. Neste artigo, primeiro analisamos o mecanismo do problema de degradação da detecção de falhas presas em testes multiciclos. Com base no resultado de nossa análise, propomos uma nova solução denominada técnica de inserção de pontos de controle FF (FF-CPI) para alcançar a redução de padrões de varredura por teste multiciclo. A técnica FF-CPI modifica os valores capturados dos flip-flops de varredura (FFs) durante a operação de captura, revertendo diretamente o valor dos FFs parciais ou carregando vetores aleatórios. A técnica FF-CPI aumenta o número de falhas detectáveis sob os padrões de captura. Os resultados experimentais dos benchmarks ISCAS89 e ITC99 validaram a eficácia da técnica FF-CPI na redução do padrão de varredura para POST.
Hanan T. Al-AWADHI
Ehime University
Tomoki AONO
Ehime University
Senling WANG
Ehime University
Yoshinobu HIGAMI
Ehime University
Hiroshi TAKAHASHI
Ehime University
Hiroyuki IWATA
Renesas Electronics Corporation
Yoichi MAEDA
Renesas Electronics Corporation
Jun MATSUSHIMA
Renesas Electronics Corporation
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Hanan T. Al-AWADHI, Tomoki AONO, Senling WANG, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, Hiroyuki IWATA, Yoichi MAEDA, Jun MATSUSHIMA, "FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST" in IEICE TRANSACTIONS on Information,
vol. E103-D, no. 11, pp. 2289-2301, November 2020, doi: 10.1587/transinf.2019EDP7235.
Abstract: Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.2019EDP7235/_p
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@ARTICLE{e103-d_11_2289,
author={Hanan T. Al-AWADHI, Tomoki AONO, Senling WANG, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, Hiroyuki IWATA, Yoichi MAEDA, Jun MATSUSHIMA, },
journal={IEICE TRANSACTIONS on Information},
title={FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST},
year={2020},
volume={E103-D},
number={11},
pages={2289-2301},
abstract={Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.},
keywords={},
doi={10.1587/transinf.2019EDP7235},
ISSN={1745-1361},
month={November},}
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TY - JOUR
TI - FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST
T2 - IEICE TRANSACTIONS on Information
SP - 2289
EP - 2301
AU - Hanan T. Al-AWADHI
AU - Tomoki AONO
AU - Senling WANG
AU - Yoshinobu HIGAMI
AU - Hiroshi TAKAHASHI
AU - Hiroyuki IWATA
AU - Yoichi MAEDA
AU - Jun MATSUSHIMA
PY - 2020
DO - 10.1587/transinf.2019EDP7235
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E103-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 2020
AB - Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.
ER -