The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Carregar vetores de teste e descarregar respostas de teste no modo shift durante o teste de varredura faz com que muitos flip-flops de varredura comutem simultaneamente. A atividade de mudança de turno resultante em torno dos flip-flops de varredura pode causar queda excessiva de IR local que pode alterar os estados de alguns flip-flops de varredura, levando à corrupção dos dados de teste. Uma abordagem comum para resolver esse problema é o deslocamento parcial, no qual múltiplas cadeias de varredura são formadas e apenas um grupo de cadeias de varredura é deslocado por vez. No entanto, os métodos anteriores baseados nesta abordagem usam agrupamento aleatório, o que pode reduzir a atividade de mudança de turno global, mas pode não ser otimizado para reduzir a atividade de mudança de turno local, resultando em alto risco remanescente de corrupção de dados de teste, mesmo quando a mudança parcial é aplicada. Este artigo propõe novos algoritmos (um ideal e um heurístico) para agrupar cadeias de varredura, com foco na redução da atividade de comutação de turno local em torno dos flip-flops de varredura, reduzindo assim o risco de corrupção de dados de teste. Os resultados experimentais em todos os grandes circuitos de benchmark ITC'99 demonstram a eficácia dos algoritmos heurísticos e ótimos propostos, bem como a escalabilidade do algoritmo heurístico.
Yucong ZHANG
Kyushu Institute of Technology
Stefan HOLST
Kyushu Institute of Technology
Xiaoqing WEN
Kyushu Institute of Technology
Kohei MIYASE
Kyushu Institute of Technology
Seiji KAJIHARA
Kyushu Institute of Technology
Jun QIAN
Advanced Micro Devices, Inc.
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Yucong ZHANG, Stefan HOLST, Xiaoqing WEN, Kohei MIYASE, Seiji KAJIHARA, Jun QIAN, "On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption" in IEICE TRANSACTIONS on Information,
vol. E104-D, no. 6, pp. 816-827, June 2021, doi: 10.1587/transinf.2020EDP7042.
Abstract: Loading test vectors and unloading test responses in shift mode during scan testing cause many scan flip-flops to switch simultaneously. The resulting shift switching activity around scan flip-flops can cause excessive local IR-drop that can change the states of some scan flip-flops, leading to test data corruption. A common approach solving this problem is partial-shift, in which multiple scan chains are formed and only one group of the scan chains is shifted at a time. However, previous methods based on this approach use random grouping, which may reduce global shift switching activity, but may not be optimized to reduce local shift switching activity, resulting in remaining high risk of test data corruption even when partial-shift is applied. This paper proposes novel algorithms (one optimal and one heuristic) to group scan chains, focusing on reducing local shift switching activity around scan flip-flops, thus reducing the risk of test data corruption. Experimental results on all large ITC'99 benchmark circuits demonstrate the effectiveness of the proposed optimal and heuristic algorithms as well as the scalability of the heuristic algorithm.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.2020EDP7042/_p
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@ARTICLE{e104-d_6_816,
author={Yucong ZHANG, Stefan HOLST, Xiaoqing WEN, Kohei MIYASE, Seiji KAJIHARA, Jun QIAN, },
journal={IEICE TRANSACTIONS on Information},
title={On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption},
year={2021},
volume={E104-D},
number={6},
pages={816-827},
abstract={Loading test vectors and unloading test responses in shift mode during scan testing cause many scan flip-flops to switch simultaneously. The resulting shift switching activity around scan flip-flops can cause excessive local IR-drop that can change the states of some scan flip-flops, leading to test data corruption. A common approach solving this problem is partial-shift, in which multiple scan chains are formed and only one group of the scan chains is shifted at a time. However, previous methods based on this approach use random grouping, which may reduce global shift switching activity, but may not be optimized to reduce local shift switching activity, resulting in remaining high risk of test data corruption even when partial-shift is applied. This paper proposes novel algorithms (one optimal and one heuristic) to group scan chains, focusing on reducing local shift switching activity around scan flip-flops, thus reducing the risk of test data corruption. Experimental results on all large ITC'99 benchmark circuits demonstrate the effectiveness of the proposed optimal and heuristic algorithms as well as the scalability of the heuristic algorithm.},
keywords={},
doi={10.1587/transinf.2020EDP7042},
ISSN={1745-1361},
month={June},}
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TY - JOUR
TI - On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption
T2 - IEICE TRANSACTIONS on Information
SP - 816
EP - 827
AU - Yucong ZHANG
AU - Stefan HOLST
AU - Xiaoqing WEN
AU - Kohei MIYASE
AU - Seiji KAJIHARA
AU - Jun QIAN
PY - 2021
DO - 10.1587/transinf.2020EDP7042
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E104-D
IS - 6
JA - IEICE TRANSACTIONS on Information
Y1 - June 2021
AB - Loading test vectors and unloading test responses in shift mode during scan testing cause many scan flip-flops to switch simultaneously. The resulting shift switching activity around scan flip-flops can cause excessive local IR-drop that can change the states of some scan flip-flops, leading to test data corruption. A common approach solving this problem is partial-shift, in which multiple scan chains are formed and only one group of the scan chains is shifted at a time. However, previous methods based on this approach use random grouping, which may reduce global shift switching activity, but may not be optimized to reduce local shift switching activity, resulting in remaining high risk of test data corruption even when partial-shift is applied. This paper proposes novel algorithms (one optimal and one heuristic) to group scan chains, focusing on reducing local shift switching activity around scan flip-flops, thus reducing the risk of test data corruption. Experimental results on all large ITC'99 benchmark circuits demonstrate the effectiveness of the proposed optimal and heuristic algorithms as well as the scalability of the heuristic algorithm.
ER -