The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Esta carta apresenta um método global baseado em recursos para avaliar a qualidade sem referência de imagens distorcidas por contraste de microscopia eletrônica de varredura (SEM). Com base nas características das imagens SEM e do sistema visual humano, as características globais das imagens SEM são extraídas como pontuação para avaliação da qualidade da imagem. Nesta carta, as informações de textura das imagens SEM são primeiro extraídas usando um filtro passa-baixa com orientação, e a quantidade de informações na parte de textura é calculada com base na entropia que reflete a complexidade da textura. Os valores singulares com quatro escalas da imagem original são então calculados, e a quantidade de mudança estrutural entre diferentes escalas é calculada e calculada a média. Finalmente, as quantidades de informações de textura e alterações estruturais são agrupadas para gerar o índice de qualidade final da imagem SEM. Resultados experimentais mostram que o método pode avaliar efetivamente a qualidade de imagens distorcidas por contraste SEM.
Fengchuan XU
Suzhou City University
Qiaoyue LI
Suzhou City University
Guilu ZHANG
Suzhou City University
Yasheng CHANG
Suzhou City University
Zixuan ZHENG
Soochow University
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Fengchuan XU, Qiaoyue LI, Guilu ZHANG, Yasheng CHANG, Zixuan ZHENG, "No Reference Quality Assessment of Contrast-Distorted SEM Images Based on Global Features" in IEICE TRANSACTIONS on Information,
vol. E106-D, no. 11, pp. 1935-1938, November 2023, doi: 10.1587/transinf.2023EDL8018.
Abstract: This letter presents a global feature-based method for evaluating the no reference quality of scanning electron microscopy (SEM) contrast-distorted images. Based on the characteristics of SEM images and the human visual system, the global features of SEM images are extracted as the score for evaluating image quality. In this letter, the texture information of SEM images is first extracted using a low-pass filter with orientation, and the amount of information in the texture part is calculated based on the entropy reflecting the complexity of the texture. The singular values with four scales of the original image are then calculated, and the amount of structural change between different scales is calculated and averaged. Finally, the amounts of texture information and structural change are pooled to generate the final quality score of the SEM image. Experimental results show that the method can effectively evaluate the quality of SEM contrast-distorted images.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.2023EDL8018/_p
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@ARTICLE{e106-d_11_1935,
author={Fengchuan XU, Qiaoyue LI, Guilu ZHANG, Yasheng CHANG, Zixuan ZHENG, },
journal={IEICE TRANSACTIONS on Information},
title={No Reference Quality Assessment of Contrast-Distorted SEM Images Based on Global Features},
year={2023},
volume={E106-D},
number={11},
pages={1935-1938},
abstract={This letter presents a global feature-based method for evaluating the no reference quality of scanning electron microscopy (SEM) contrast-distorted images. Based on the characteristics of SEM images and the human visual system, the global features of SEM images are extracted as the score for evaluating image quality. In this letter, the texture information of SEM images is first extracted using a low-pass filter with orientation, and the amount of information in the texture part is calculated based on the entropy reflecting the complexity of the texture. The singular values with four scales of the original image are then calculated, and the amount of structural change between different scales is calculated and averaged. Finally, the amounts of texture information and structural change are pooled to generate the final quality score of the SEM image. Experimental results show that the method can effectively evaluate the quality of SEM contrast-distorted images.},
keywords={},
doi={10.1587/transinf.2023EDL8018},
ISSN={1745-1361},
month={November},}
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TY - JOUR
TI - No Reference Quality Assessment of Contrast-Distorted SEM Images Based on Global Features
T2 - IEICE TRANSACTIONS on Information
SP - 1935
EP - 1938
AU - Fengchuan XU
AU - Qiaoyue LI
AU - Guilu ZHANG
AU - Yasheng CHANG
AU - Zixuan ZHENG
PY - 2023
DO - 10.1587/transinf.2023EDL8018
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E106-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 2023
AB - This letter presents a global feature-based method for evaluating the no reference quality of scanning electron microscopy (SEM) contrast-distorted images. Based on the characteristics of SEM images and the human visual system, the global features of SEM images are extracted as the score for evaluating image quality. In this letter, the texture information of SEM images is first extracted using a low-pass filter with orientation, and the amount of information in the texture part is calculated based on the entropy reflecting the complexity of the texture. The singular values with four scales of the original image are then calculated, and the amount of structural change between different scales is calculated and averaged. Finally, the amounts of texture information and structural change are pooled to generate the final quality score of the SEM image. Experimental results show that the method can effectively evaluate the quality of SEM contrast-distorted images.
ER -