The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Nos recentes VLSIs de alta densidade e baixa potência, a ocorrência de erros suaves tornou-se um problema significativo. Recentemente, erros de software ocorrem frequentemente não apenas no sistema de memória, mas também em circuitos lógicos. Com base neste ponto de vista, foram propostas algumas construções de FFs tolerantes a erros suaves. Um FF convencional consiste em algumas travas mestre e escrava e elementos C. No FF, os pulsos de erro suave que ocorrem nas partes combinacionais dos circuitos lógicos são corrigidos, desde que a largura dos pulsos seja estreita, ou seja, dentro de uma largura especificada. Entretanto, pulsos de erro com largura ampla não são detectados nem corrigidos no FF. Este artigo apresenta uma construção de FFs tolerantes a erros suaves, modificando o FF tolerante a erros suaves convencional. Os FFs propostos têm a capacidade de detectar pulsos de erro com largura ampla, bem como a capacidade de corrigir aqueles com largura estreita. Os FFs propostos também são capazes de detectar erros graves. A avaliação mostra a capacidade de tolerância a erros suaves, características AC, sobrecarga de área e consumo de energia dos FFs.
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Shuangyu RUAN, Kazuteru NAMBA, Hideo ITO, "Construction of Soft-Error-Tolerant FF with Wide Error Pulse Detecting Capability" in IEICE TRANSACTIONS on Information,
vol. E92-D, no. 8, pp. 1534-1541, August 2009, doi: 10.1587/transinf.E92.D.1534.
Abstract: In the recent high-density and low-power VLSIs, the occurrence of soft errors has become a significant problem. Recently, soft errors frequently occur on not only memory system but also logic circuits. Based on this standpoint, some constructions of soft-error-tolerant FFs were proposed. A conventional FF consists of some master and slave latches and C-elements. In the FF, soft error pulses occurring on combinational parts of logic circuits are corrected as long as the width of the pulses is narrow, that is within a specified width. However, error pulses with wide width are neither detected nor corrected in the FF. This paper presents a construction of soft-error-tolerant FFs by modifying the conventional soft-error-tolerant FF. The proposed FFs have the capability to detect error pulses having wide width as well as the capability to correct those having narrow width. The proposed FFs are also capable of detecting hard errors. The evaluation shows the soft-error-tolerant capability, AC characteristics, area overhead and power consumption of the FFs.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E92.D.1534/_p
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@ARTICLE{e92-d_8_1534,
author={Shuangyu RUAN, Kazuteru NAMBA, Hideo ITO, },
journal={IEICE TRANSACTIONS on Information},
title={Construction of Soft-Error-Tolerant FF with Wide Error Pulse Detecting Capability},
year={2009},
volume={E92-D},
number={8},
pages={1534-1541},
abstract={In the recent high-density and low-power VLSIs, the occurrence of soft errors has become a significant problem. Recently, soft errors frequently occur on not only memory system but also logic circuits. Based on this standpoint, some constructions of soft-error-tolerant FFs were proposed. A conventional FF consists of some master and slave latches and C-elements. In the FF, soft error pulses occurring on combinational parts of logic circuits are corrected as long as the width of the pulses is narrow, that is within a specified width. However, error pulses with wide width are neither detected nor corrected in the FF. This paper presents a construction of soft-error-tolerant FFs by modifying the conventional soft-error-tolerant FF. The proposed FFs have the capability to detect error pulses having wide width as well as the capability to correct those having narrow width. The proposed FFs are also capable of detecting hard errors. The evaluation shows the soft-error-tolerant capability, AC characteristics, area overhead and power consumption of the FFs.},
keywords={},
doi={10.1587/transinf.E92.D.1534},
ISSN={1745-1361},
month={August},}
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TY - JOUR
TI - Construction of Soft-Error-Tolerant FF with Wide Error Pulse Detecting Capability
T2 - IEICE TRANSACTIONS on Information
SP - 1534
EP - 1541
AU - Shuangyu RUAN
AU - Kazuteru NAMBA
AU - Hideo ITO
PY - 2009
DO - 10.1587/transinf.E92.D.1534
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E92-D
IS - 8
JA - IEICE TRANSACTIONS on Information
Y1 - August 2009
AB - In the recent high-density and low-power VLSIs, the occurrence of soft errors has become a significant problem. Recently, soft errors frequently occur on not only memory system but also logic circuits. Based on this standpoint, some constructions of soft-error-tolerant FFs were proposed. A conventional FF consists of some master and slave latches and C-elements. In the FF, soft error pulses occurring on combinational parts of logic circuits are corrected as long as the width of the pulses is narrow, that is within a specified width. However, error pulses with wide width are neither detected nor corrected in the FF. This paper presents a construction of soft-error-tolerant FFs by modifying the conventional soft-error-tolerant FF. The proposed FFs have the capability to detect error pulses having wide width as well as the capability to correct those having narrow width. The proposed FFs are also capable of detecting hard errors. The evaluation shows the soft-error-tolerant capability, AC characteristics, area overhead and power consumption of the FFs.
ER -