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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
O teste de limite, que é um método de teste de LSI baseado na aceitabilidade de falhas, é eficaz no aumento do rendimento de LSIs e no endurecimento seletivo para sistemas LSI. Neste artigo, propomos modelos de geração de testes para geração de testes de limite. Utilizando os modelos propostos, podemos identificar eficientemente falhas aceitáveis e gerar padrões de teste para falhas inaceitáveis com um algoritmo geral de geração de testes, ou seja, sem um algoritmo de geração de testes especializado para testes de limiar. Os resultados experimentais mostram que a nossa abordagem é, na prática, eficaz.
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Hideyuki ICHIHARA, Kenta SUTOH, Yuki YOSHIKAWA, Tomoo INOUE, "A Practical Threshold Test Generation for Error Tolerant Application" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 10, pp. 2776-2782, October 2010, doi: 10.1587/transinf.E93.D.2776.
Abstract: Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.2776/_p
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@ARTICLE{e93-d_10_2776,
author={Hideyuki ICHIHARA, Kenta SUTOH, Yuki YOSHIKAWA, Tomoo INOUE, },
journal={IEICE TRANSACTIONS on Information},
title={A Practical Threshold Test Generation for Error Tolerant Application},
year={2010},
volume={E93-D},
number={10},
pages={2776-2782},
abstract={Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.},
keywords={},
doi={10.1587/transinf.E93.D.2776},
ISSN={1745-1361},
month={October},}
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TY - JOUR
TI - A Practical Threshold Test Generation for Error Tolerant Application
T2 - IEICE TRANSACTIONS on Information
SP - 2776
EP - 2782
AU - Hideyuki ICHIHARA
AU - Kenta SUTOH
AU - Yuki YOSHIKAWA
AU - Tomoo INOUE
PY - 2010
DO - 10.1587/transinf.E93.D.2776
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2010
AB - Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.
ER -