The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
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The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Os requisitos de qualidade estão espalhados por uma especificação de requisitos, portanto é difícil medir e rastrear tais requisitos de qualidade para validar a especificação em relação às necessidades das partes interessadas. Propusemos uma técnica chamada “análise de espectro para requisitos de qualidade”, que permitiu aos analistas classificar uma especificação de requisitos para medir e rastrear os requisitos de qualidade na especificação. Da mesma forma que um espectro em óptica, um espectro de qualidade de uma especificação mostra uma característica quantitativa da especificação em relação à qualidade. Portanto, podemos comparar uma especificação de um sistema com outra no que diz respeito à qualidade. Como resultado, podemos validar tal especificação porque podemos verificar se a especificação possui características de qualidade comuns e conhecer suas características específicas em relação às especificações de sistemas similares existentes. No entanto, a nossa primeira análise de espectro para requisitos de qualidade exigiu muito esforço e conhecimento de um domínio de problema e foi difícil reutilizar esse conhecimento para reduzir o esforço. Assim, introduzimos o conhecimento de domínio denominado mapa de características de termo (TCM) para reutilizar o conhecimento em nossa análise de espectro de qualidade. Através de vários experimentos, avaliamos nossa análise de espectro, e as principais descobertas são as seguintes. Primeiro, confirmamos que as especificações de sistemas semelhantes possuem espectros de qualidade semelhantes. Em segundo lugar, os resultados da análise de espectro utilizando TCM são objetivos, ou seja, diferentes analistas podem gerar quase os mesmos espectros quando analisam a mesma especificação.
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Haruhiko KAIYA, Masaaki TANIGAWA, Shunichi SUZUKI, Tomonori SATO, Akira OSADA, Kenji KAIJIRI, "Improving Reliability of Spectrum Analysis for Software Quality Requirements Using TCM" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 4, pp. 702-712, April 2010, doi: 10.1587/transinf.E93.D.702.
Abstract: Quality requirements are scattered over a requirements specification, thus it is hard to measure and trace such quality requirements to validate the specification against stakeholders' needs. We proposed a technique called "spectrum analysis for quality requirements" which enabled analysts to sort a requirements specification to measure and track quality requirements in the specification. In the same way as a spectrum in optics, a quality spectrum of a specification shows a quantitative feature of the specification with respect to quality. Therefore, we can compare a specification of a system to another one with respect to quality. As a result, we can validate such a specification because we can check whether the specification has common quality features and know its specific features against specifications of existing similar systems. However, our first spectrum analysis for quality requirements required a lot of effort and knowledge of a problem domain and it was hard to reuse such knowledge to reduce the effort. We thus introduce domain knowledge called term-characteristic map (TCM) to reuse the knowledge for our quality spectrum analysis. Through several experiments, we evaluate our spectrum analysis, and main finding are as follows. First, we confirmed specifications of similar systems have similar quality spectra. Second, results of spectrum analysis using TCM are objective, i.e., different analysts can generate almost the same spectra when they analyze the same specification.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.702/_p
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@ARTICLE{e93-d_4_702,
author={Haruhiko KAIYA, Masaaki TANIGAWA, Shunichi SUZUKI, Tomonori SATO, Akira OSADA, Kenji KAIJIRI, },
journal={IEICE TRANSACTIONS on Information},
title={Improving Reliability of Spectrum Analysis for Software Quality Requirements Using TCM},
year={2010},
volume={E93-D},
number={4},
pages={702-712},
abstract={Quality requirements are scattered over a requirements specification, thus it is hard to measure and trace such quality requirements to validate the specification against stakeholders' needs. We proposed a technique called "spectrum analysis for quality requirements" which enabled analysts to sort a requirements specification to measure and track quality requirements in the specification. In the same way as a spectrum in optics, a quality spectrum of a specification shows a quantitative feature of the specification with respect to quality. Therefore, we can compare a specification of a system to another one with respect to quality. As a result, we can validate such a specification because we can check whether the specification has common quality features and know its specific features against specifications of existing similar systems. However, our first spectrum analysis for quality requirements required a lot of effort and knowledge of a problem domain and it was hard to reuse such knowledge to reduce the effort. We thus introduce domain knowledge called term-characteristic map (TCM) to reuse the knowledge for our quality spectrum analysis. Through several experiments, we evaluate our spectrum analysis, and main finding are as follows. First, we confirmed specifications of similar systems have similar quality spectra. Second, results of spectrum analysis using TCM are objective, i.e., different analysts can generate almost the same spectra when they analyze the same specification.},
keywords={},
doi={10.1587/transinf.E93.D.702},
ISSN={1745-1361},
month={April},}
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TY - JOUR
TI - Improving Reliability of Spectrum Analysis for Software Quality Requirements Using TCM
T2 - IEICE TRANSACTIONS on Information
SP - 702
EP - 712
AU - Haruhiko KAIYA
AU - Masaaki TANIGAWA
AU - Shunichi SUZUKI
AU - Tomonori SATO
AU - Akira OSADA
AU - Kenji KAIJIRI
PY - 2010
DO - 10.1587/transinf.E93.D.702
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 4
JA - IEICE TRANSACTIONS on Information
Y1 - April 2010
AB - Quality requirements are scattered over a requirements specification, thus it is hard to measure and trace such quality requirements to validate the specification against stakeholders' needs. We proposed a technique called "spectrum analysis for quality requirements" which enabled analysts to sort a requirements specification to measure and track quality requirements in the specification. In the same way as a spectrum in optics, a quality spectrum of a specification shows a quantitative feature of the specification with respect to quality. Therefore, we can compare a specification of a system to another one with respect to quality. As a result, we can validate such a specification because we can check whether the specification has common quality features and know its specific features against specifications of existing similar systems. However, our first spectrum analysis for quality requirements required a lot of effort and knowledge of a problem domain and it was hard to reuse such knowledge to reduce the effort. We thus introduce domain knowledge called term-characteristic map (TCM) to reuse the knowledge for our quality spectrum analysis. Through several experiments, we evaluate our spectrum analysis, and main finding are as follows. First, we confirmed specifications of similar systems have similar quality spectra. Second, results of spectrum analysis using TCM are objective, i.e., different analysts can generate almost the same spectra when they analyze the same specification.
ER -